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eBook Records of the IEEE International Workshop on Memory Technology, Design and Testing August 8-9, 1994 San Jose, California ePub

eBook Records of the IEEE International Workshop on Memory Technology, Design and Testing August 8-9, 1994 San Jose, California ePub

by Rochit Rajsuman

  • ISBN: 081866245X
  • Category: Computer Science
  • Subcategory: Computers
  • Author: Rochit Rajsuman
  • Language: English
  • Publisher: IEEE (August 1, 1994)
  • Pages: 41
  • ePub book: 1965 kb
  • Fb2 book: 1547 kb
  • Other: mbr lit rtf doc
  • Rating: 4.8
  • Votes: 197

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Published August 1994 by Institute of Electrical & Electronics Enginee.

Conference held August 8-9, 1994 in San Jose, California.

We are like Rottentomatoes or Metacritic for books. We also do book giveaways. Conference held August 8-9, 1994 in San Jose, California.

Workshop on Memory Testing, San Jose, CA, August 9–10, 1993. van de Goor and B. Smit, The Automatic Generation of March Tests, Records of the 1994 IEEE Int. vol. C-29, pp. 419–429, June 1980. Workshop on Memory Technology, Design and Testing, August 8–9, 1994.

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing . Nineteen papers and a keynote address comprise the proceedings of this August 2000 workshop.

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California. The papers are organized into sections on failure mechanisms and defects, flash and EEPROM design, new ideas, test and yield, memory testing and built-in self-test, memory design, and diagnosis.

oceedings{T, title {Records of the 2000 IEEE International . Rochit Rajsuman, Thomas R. Wik.

oceedings{T, title {Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA}, author {Rochit Rajsuman and Thomas R. Wik}, year {1995} }. Specific top. Save to Library.

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The chart shows the evolution of the average number of times documents published in a journal in the past two, three and four years have been cited in the current year

The chart shows the evolution of the average number of times documents published in a journal in the past two, three and four years have been cited in the current year. The two years line is equivalent to journal impact factor ™ (Thomson Reuters) metric. Evolution of the total number of citations and journal's self-citations received by a journal's published documents during the three previous years. Journal Self-citation is defined as the number of citation from a journal citing article to articles published by the same journal.

Proceedings of the August 1994 workshop, presenting papers on topics such as design for testability, physical defects and failure analysis, innovative designs, memory test algorithms, fault modeling, automatic test generation, built-in self-test, and radiation hardening issues. Lacks an index. Annotation copyright Book News, Inc. Portland, Or.

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